Microscopy sample inspection.

A trimodal atomic force microscopy probe sensor for the investigation of the pore in native cell membrane

Postdoctoral Presentation by Dr. Sarmiza Stanca from Leibniz Institute for Photonic Technologies
Microscopy sample inspection.
Image: Jan-Peter Kasper (University of Jena)
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End
Types of event
Conference
Venue
Abbeanum
Fröbelstieg 1, Hörsaal 1
07743 Jena
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Organized by
Faculty of Physics and Astronomy
Language of the event
English
Barrier-free access
Yes
Public
Yes